Orb Optronix’ state-of-the-art LED measurement services are performed within Orb’s onsite photometery and radiometery laboratory. We are unique in that we provide complete electrical, thermal and optical characterization of Light Emitting Diodes (LEDs) and LED products. LED light output varies depending upon electrical input characteristics, temperature, lifetime, and manufacturing variability. We help our customers to quantify LED performance as a function of many variables for their LED part qualification testing, product development engineering, incoming inspection and quality control needs. Our photometry and radiometery metrology lab is fully NIST traceable and equipped to handle the demands of LED testing over a wide range of electrical drive and thermal variables. Since LED light output, in terms of wavelength and total flux, is dependent on so many variables, complete LED characterization is often required for product development of products utilizing LEDs. LED Manufacturer’s spec sheets often lack pertinent data about true performance under real operational conditions. Orb Optronix’ LED Test & Measurement Services solves this problem for you.
| Services Types |
| Integrating Sphere Measurements |
| CIE 127 Measurement |
| Goniometric Measurements |
| Lifetime Testing |
| Burn-In Services and Studies |
| Full Image Light Source Modeling |
| Radiance/Luminance Measurements |
| Incoming Inspection Testing |
| Quality Control |
| LED Binning & Sorting |
| Junction Temperature Measurement |
| Thermal Resistance Measurement |
| Thermal Conductivity Measurement |
| Devices We Test |
| Discrete LEDs |
| Luminaires |
| LED Array |
| LED Replacement Bulbs |
| LED Subsystems |
| RGB LED Backlight Units (BLUs) |
| LED Subsystems |
| LED Products |
| High-Power LEDs |
| Parameters We Measure |
| Peak Wavelength (nm) |
| Dominant Wavelength (nm) |
| Spectral Bandwidth (nm) |
| Total Radiant Flux (W) |
| Total Luminous Flux (Lumens) |
| CIE 127 (cd and W/sr) |
| Correlated Color Temperature |
| Angular Distribution (cd and W/sr) |
| Chromaticity Coordinates: |
| CIE (x,y) and (u',v') |
| Forward Voltage (V) |
| Forward Current (Amps) |
| Junction Temperature |
| Case Temperature |
| Thermal Time Constants |
| Thermal Resistance |
| Thermal Conductivity |
| Lab Capabilities |
| Light Measurement Capabilities |
| Spectral: 380-780 nm, 0 to 1000 watts |
| Flux: 300-1100 nm, 0 to 1000 Watts |
| Thermal Capabilities |
| TEC (Peltier) Driving |
| 0 C to 90 C Tc for 20 Watt DUT |
| 20 C to 90 C Tc for 80 Watt DUT |
| Ambient Air Driving |
| 20C to 80C |
| Power Capabilities |
| DC: 0-200V, 0-20 Amps |
| AC: 0-110 VAC, 0-20 Amps |
| PWM: 0-10V, 0-5 Amps, 0-100kHz, |
| 0-100% Duty Cycle |
Product Development Data: Since LED light output, in terms of wavelength and total flux, is dependent on so many variables, complete LED characterization is often required for product development of products utilizing LEDs. Orb Optronix applies LED test and measurement to product development cycle for three reasons:
LED Qualification Testing: We perform complete LED chanarcterization of discrete LEDs involving flux output, dominant wavelength, peak wavelength, chromaticity coordinates, and spectral bandwidth as a function of forward current, forward voltage, ambient air temperature (Ta), Case Temperature (Tc), and time. This includes electrical input parameters in pulse width modulated mode such as frequency and duty cycle.
Incoming Inspection Testing: We perform LED burn-in for our customers as well as develop incoming test procedures and protocols for LED burn-in for incoming inspection.
Quality Control Inspection: We perform tests of LED device and array output as a function of ambient air temperature to ensure that products and subsystems pass light output characteristics as a function of environmental conditions.